Optical characterization of native defects in 4h-sic irradiated by 10 mev electrons with subsequent annealing
Zhang, Y., Wang, H., Wang, K., Tian, Y., Wang, Y., Li, J., Chai, Y.
Optical characterization of native defects in 4h-sic irradiated by 10 mev electrons with subsequent annealing, Y. Zhang, K. Wang, H. Wang [et al.]
// Журнал прикладной спектроскопии .-
2020 .-
Т. 87, № 6. - С. 891-896 .-
